The influence of various support materials, such as nickel and titanium, on the structure of TiO, RuO, RuO/TiO and IrO/ TiO electrocatalytic thin films was investigated in detail by secondary ion mass spectrometry (SIMS). The coatings were prepared by heat treatment following literature procedure. It is shown that various support materials can favor the formation and can influence the ion yield of ionic species with different oxidation states. The penetration characteristics of TiO in two-component systems on the same support are influenced by the nature of the noble metal. Furthermore, changes in the structure of the coatings due to method and time of storage may be detected by SIMS analysis. © 1997 Elsevier Science B.V.

Influence of support material on formation of electrocatalytic thin films - A secondary ion mass spectrometry study

Piccirillo C;Fabrizio M
1997

Abstract

The influence of various support materials, such as nickel and titanium, on the structure of TiO, RuO, RuO/TiO and IrO/ TiO electrocatalytic thin films was investigated in detail by secondary ion mass spectrometry (SIMS). The coatings were prepared by heat treatment following literature procedure. It is shown that various support materials can favor the formation and can influence the ion yield of ionic species with different oxidation states. The penetration characteristics of TiO in two-component systems on the same support are influenced by the nature of the noble metal. Furthermore, changes in the structure of the coatings due to method and time of storage may be detected by SIMS analysis. © 1997 Elsevier Science B.V.
1997
Depth profiling
Electrocatalysis
Iridium dioxide
Oxide film electrode
Ruthenium dioxide
Secondary ion mass spectrometry
Titanium dioxide
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/426835
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 5
  • ???jsp.display-item.citation.isi??? ND
social impact