The ALPIDE silicon pixel detector, designed for the upgrade of the ALICE Inner Tracking System at the CERN LHC, is potentially well suited also for usage in other fields, as for medical applications. In particular, it could provide excellent capabilities as detecting probe for radioguided surgery in oncology, in association to positron-emitting radiotracers. In this respect, to quantify the expected performance it is crucial to measure the sensitivity to low-energy photons, which constitute the main background for revealing the positron radiation. Due to its thin epitaxial sensitive layer, the ALPIDE is expected to be almost insensitive to photons. A measurement of the ALPIDE efficiency for the detection of 662 keV photons, emitted by a Cs-137 radioactive source, is reported in this paper. A value of 0.089%, with a relative uncertainty of 20%, was obtained, granting an excellent rejection of low-energy photons compared to other proposed devices.

Study of the photon rejection of the ALPIDE pixel detector for medical applications

Mazzone A;
2019

Abstract

The ALPIDE silicon pixel detector, designed for the upgrade of the ALICE Inner Tracking System at the CERN LHC, is potentially well suited also for usage in other fields, as for medical applications. In particular, it could provide excellent capabilities as detecting probe for radioguided surgery in oncology, in association to positron-emitting radiotracers. In this respect, to quantify the expected performance it is crucial to measure the sensitivity to low-energy photons, which constitute the main background for revealing the positron radiation. Due to its thin epitaxial sensitive layer, the ALPIDE is expected to be almost insensitive to photons. A measurement of the ALPIDE efficiency for the detection of 662 keV photons, emitted by a Cs-137 radioactive source, is reported in this paper. A value of 0.089%, with a relative uncertainty of 20%, was obtained, granting an excellent rejection of low-energy photons compared to other proposed devices.
2019
Istituto di Cristallografia - IC
Inglese
Proceedings - 2019 8th International Workshop on Advances in Sensors and Interfaces, IWASI 2019
152
157
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85071492659&doi=10.1109%2fIWASI.2019.8791306&partnerID=40&md5=80467bb4dfdb818867567a5329bb1007
13-14/06/2019
Active Pixel Sensor | CMOS | Silicon-On-Insulator
cited By 0
1
none
Colamaria F;Trombetta G;Bruno; G E;De Robertis G;Manzari V;Mazzone A;Pastore; C
273
info:eu-repo/semantics/conferenceObject
04 Contributo in convegno::04.01 Contributo in Atti di convegno
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/427364
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 0
  • ???jsp.display-item.citation.isi??? ND
social impact