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Synchrotron Radiation EXAFS studies with femtometer accuracy

2008
2008
Istituto di fotonica e nanotecnologie - IFN
-2008, International conference “Functional materials and nanotechnologies”
No
Riga (Latvia)
Abstract: In the last years, the XAFS experimental techniques have undergo remarkable developments: experiments with unprecedented accuracy under extreme conditions of high pressure and temperature, that were not even conceivable just a few years ago, can nowadays be performed. New applications, stimulated by accurate experimental temperature-dependent XAFS measurements on Ge, ReO3 and Ag2O, can be carried out [1]. In parallel with the experimental techniques, XAFS theory and data analysis have made considerable progress. Our last experience at the ESRF beam-line BM-29 on Ge and ReO3 shows that also 10 femtometer (10-4Å) “barrier” is now attainable, even though such determination is far from trivial. A very high stability and reproducibility in the energy axis ”E/(E-Eo) about 2•10-4 (Eo - photoelectron zero energy in XAFS) guarantees an accuracy of 2•10-4Å (20 femtometer) and consequently ”R/R H 10-4 in the determination of variation of interatomic distances (R) in the first, second, third and fourth coordination shells of ReO3 and Ge. Nowadays, we have done also theoretical and experimental estimations at the Ge K-edge that the limit of the accuracy of the XAFS measurement at the BM-29 is about two femtometer (2•10-5 Å ) in the special experimental configuration. Therefore, new effects can be studied in such approach, for example isotopic effect on XAFS and isotopic effect on the lattice dynamics and anharmonic properties of Ge70 and Ge76.
6
none
Jpurans, ; Akuzmin, ; Pfornasini, ; Gdalba, ; Frocca, ; Sitiutiunnikov,
273
info:eu-repo/semantics/conferenceObject
04 Contributo in convegno::04.01 Contributo in Atti di convegno
04.01 Contributo in Atti di convegno
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/431248
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