High energy implantation of medium-light elements such as oxygen and carbon was performed in X-cut LiNbO3 single crystals in order to prepare high quality optical waveguides. The compositional and damage profiles, obtained by exploiting the secondary ion mass spectrometry and Rutherford back-scattering techniques respectively, were correlated to the structural properties measured by the high resolution X-ray diffraction. This study evidences the development of tensile strain induced by the ion implantation that can contribute to the decrease of the ordinary refractive index variation through the photo-elastic effect.

Structural and compositional characterization of X-cut LiNbO3 crystals implanted with high energy oxygen and carbon ions

Bentini GG;Bianconi M;
2005

Abstract

High energy implantation of medium-light elements such as oxygen and carbon was performed in X-cut LiNbO3 single crystals in order to prepare high quality optical waveguides. The compositional and damage profiles, obtained by exploiting the secondary ion mass spectrometry and Rutherford back-scattering techniques respectively, were correlated to the structural properties measured by the high resolution X-ray diffraction. This study evidences the development of tensile strain induced by the ion implantation that can contribute to the decrease of the ordinary refractive index variation through the photo-elastic effect.
2005
Istituto per la Microelettronica e Microsistemi - IMM
240
174
177
10
info:eu-repo/semantics/article
262
Bentini, Gg; Bianconi, M; Cerutti, A; Chiarini, M; Pennestri, G; Sada, C; Argiolas, N; Bazzan, M; Mazzoldi, P; Guzzi, R
01 Contributo su Rivista::01.01 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/437739
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