Preparation of chameleon coatings using an Ionized Jet Deposition (IJD) technique isreported in the present paper. IJD is a new flexible method for thin film deposition developed by Noivion,Srl. The chameleon coatings are thin films characterised by a distinct change of their tribologicalproperties according to the external conditions. The deposited films of SiC and TiN materials wereexamined by the Raman spectroscopy, SEM and XPS. The results of the Raman spectroscopy haveproved an amorphous structure of SiC films. The data from XPS on TiN films have shown that thefilms are heavily oxidized, but also prove that the films are composed of TiN and pure Ti. The SEMprovided information about the size of grains and particles constituting the deposited films, which isimportant for tribological properties of the films. Deposition of the chameleon coating is very complexproblem and IJD could be ideal method for preparation of this coating.

PREPARING OF THE CHAMELEON COATING BY THE ION JETDEPOSITION METHOD

Lucrezia Aversa;Petr Nozar
2017

Abstract

Preparation of chameleon coatings using an Ionized Jet Deposition (IJD) technique isreported in the present paper. IJD is a new flexible method for thin film deposition developed by Noivion,Srl. The chameleon coatings are thin films characterised by a distinct change of their tribologicalproperties according to the external conditions. The deposited films of SiC and TiN materials wereexamined by the Raman spectroscopy, SEM and XPS. The results of the Raman spectroscopy haveproved an amorphous structure of SiC films. The data from XPS on TiN films have shown that thefilms are heavily oxidized, but also prove that the films are composed of TiN and pure Ti. The SEMprovided information about the size of grains and particles constituting the deposited films, which isimportant for tribological properties of the films. Deposition of the chameleon coating is very complexproblem and IJD could be ideal method for preparation of this coating.
2017
978-80-01-06298-2
Ion Jet Deposition
Chameleon coating
Raman spectroscopy
Scanning electron microscope
X-ray photoelectron spectroscopy
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/441449
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