In this work, a variety of semiconducting oxides were prepared and principally characterized by means of spectroscopic techniques (absorbance FT-IR, diffuse reflectance UV-Vis-NIR) to shed light on the electronic properties and defects involved at the roots of gas sensing capabilities. The thick films were obtained by screen printing technology on which electrical characterization and gas sensing measurements were performed. From the cross analysis of the results, a description of the specific sensing mechanism for each material is proposed.

Semiconductor Oxide Gas Sensors: Correlation between Conduction Mechanisms and Their Sensing Performances

Ambra Fioravanti;Maria Cristina Carotta
2021

Abstract

In this work, a variety of semiconducting oxides were prepared and principally characterized by means of spectroscopic techniques (absorbance FT-IR, diffuse reflectance UV-Vis-NIR) to shed light on the electronic properties and defects involved at the roots of gas sensing capabilities. The thick films were obtained by screen printing technology on which electrical characterization and gas sensing measurements were performed. From the cross analysis of the results, a description of the specific sensing mechanism for each material is proposed.
2021
Istituto di Scienze e Tecnologie per l'Energia e la Mobilità Sostenibili - STEMS
thick film gas sensors
nanostructured semiconductor oxides
UV-Vis-NIR and FT-IR spectroscopies
electrical characterization
sensing mechanisms
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/448220
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? ND
social impact