In this paper, we adopt our in-house physics-based solver VENUS (Vcsel Electro-optho-thermal NUmerical Simulator) to assess the static output characteristics of an AlGaAs/GaAs TJ-VCSEL emitting at 850 nm. To this aim, VENUS is extended to exploit a combined drift-diffusion model and NEGF formalism, that accurately captures tunneling effects across the TJ. The results are compared to a commercial pin-like VCSEL, at temperatures ranging from 20 to 110°C, to cover a broad set of operations from room temperature to harsh environments.

Physics-based modeling of AlGaAs tunnel junction VCSELs: a comparative appraisal

Gullino Alberto;Tibaldi Alberto;Bertazzi Francesco;Goano Michele;Debernardi Pierluigi
2023

Abstract

In this paper, we adopt our in-house physics-based solver VENUS (Vcsel Electro-optho-thermal NUmerical Simulator) to assess the static output characteristics of an AlGaAs/GaAs TJ-VCSEL emitting at 850 nm. To this aim, VENUS is extended to exploit a combined drift-diffusion model and NEGF formalism, that accurately captures tunneling effects across the TJ. The results are compared to a commercial pin-like VCSEL, at temperatures ranging from 20 to 110°C, to cover a broad set of operations from room temperature to harsh environments.
2023
Istituto di Elettronica e di Ingegneria dell'Informazione e delle Telecomunicazioni - IEIIT
9798350314298
NEGF
VCSEL
Drift-diffusion
Physics-based modeling
Opto
tunnel junction
optoelectronic devices
numerical simulation
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/454072
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