An interferometric method is proposed, that can be used to measure simultaneously the thickness and the refractive index of thin films. The experimental set-up employies a lateral-shear interferometer and a DFB laser to scan across the wavelength range
Method for measuring the refractive index and the thickness of transparent plates by a lateral-shear, wavelength scanning interferometer
De Nicola S;Coppola G;Ferraro P;Iodice M
2003
Abstract
An interferometric method is proposed, that can be used to measure simultaneously the thickness and the refractive index of thin films. The experimental set-up employies a lateral-shear interferometer and a DFB laser to scan across the wavelength rangeFile in questo prodotto:
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