The mechanism of field-effect doping in the 123 high critical temperature superconductors (HTS) has been investigated by x-ray absorption spectroscopy in the presence of an electric field. We demonstrate that holes are created at the CuO chains of the charge reservoir and that field-effect doping of the CuO2 planes occurs by charge transfer, from the chains to the planes, of a fraction of the overall induced holes. The electronic properties of the charge reservoir and of the dielectric-HTS interface determine the electric field doping of the CuO2 planes.

Indirect electric field doping of the CuO2 planes of the cuprate NdBa2Cu3O7 superconductor

Salluzzo M;Ghiringhelli G;De Luca GM;Vaglio R
2008

Abstract

The mechanism of field-effect doping in the 123 high critical temperature superconductors (HTS) has been investigated by x-ray absorption spectroscopy in the presence of an electric field. We demonstrate that holes are created at the CuO chains of the charge reservoir and that field-effect doping of the CuO2 planes occurs by charge transfer, from the chains to the planes, of a fraction of the overall induced holes. The electronic properties of the charge reservoir and of the dielectric-HTS interface determine the electric field doping of the CuO2 planes.
2008
INFM
Istituto Superconduttori, materiali innovativi e dispositivi - SPIN
Istituto Superconduttori, materiali innovativi e dispositivi - SPIN
Electric field effect
field effect transistor
X.ray Absorption spectroscopy
THIN-FILMS
YBA2CU3O7-DELTA FILMS
SYSTEMS
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/457670
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