Analysis of factors that regulate the peak fittings of XPS Ce3d spectra of cerium oxides
Comment on "Thickness-dependent morphology, microstructure, adsorption and surface free energy of sputtered CeO2 films", by Tan et al. Ceram. Int. 46 (2020) 13925-13931
Ernesto Paparazzo
2021
Abstract
Analysis of factors that regulate the peak fittings of XPS Ce3d spectra of cerium oxidesFile in questo prodotto:
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