The optical properties of thermally evaporated PDI-8CN(2) thin films have been investigated using Variable Angle Spectroscopic Ellipsometry (VASE). These layers were deposited on SiO2 dielectric layers as a means of measuring their properties on a standard interface. Regression analysis was used to determine the optical constants (refractive index and extinction coefficient) across a bandwidth of 300 - 900 nm. Anisotropy of the films was investigated, as well as the thickness dependence of the optical constants. This paper presents the results of these investigations. (C) 2010 Published by Elsevier B. V.
Optical properties of thermally evaporated PDI-8CN(2) thin films
Barra M;Cassinese A;
2011
Abstract
The optical properties of thermally evaporated PDI-8CN(2) thin films have been investigated using Variable Angle Spectroscopic Ellipsometry (VASE). These layers were deposited on SiO2 dielectric layers as a means of measuring their properties on a standard interface. Regression analysis was used to determine the optical constants (refractive index and extinction coefficient) across a bandwidth of 300 - 900 nm. Anisotropy of the films was investigated, as well as the thickness dependence of the optical constants. This paper presents the results of these investigations. (C) 2010 Published by Elsevier B. V.File in questo prodotto:
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