Abstract: Electro optical absorption in hydrogenated amorphous silicon (?- Si:H) - amorphous silicon carbonitride (?-SiCxNy) multilayers have been studied in two different planar multistacks waveguides. The waveguides were realized by plasma enhanced chemical vapour deposition (PECVD), a technology compatible with the standard microelectronic processes. Light absorption is induced at ? = 1.55 ?m through the application of an electric field which induces free carrier accumulation across the multiple insulator/ semiconductor device structure. The experimental performances have been compared to those obtained through calculations using combined twodimensional (2-D) optical and electrical simulations.

Electro-optically induced absorption in ±-Si:H/±-SiCN waveguiding multistacks

Summonte C
2008

Abstract

Abstract: Electro optical absorption in hydrogenated amorphous silicon (?- Si:H) - amorphous silicon carbonitride (?-SiCxNy) multilayers have been studied in two different planar multistacks waveguides. The waveguides were realized by plasma enhanced chemical vapour deposition (PECVD), a technology compatible with the standard microelectronic processes. Light absorption is induced at ? = 1.55 ?m through the application of an electric field which induces free carrier accumulation across the multiple insulator/ semiconductor device structure. The experimental performances have been compared to those obtained through calculations using combined twodimensional (2-D) optical and electrical simulations.
2008
Istituto per la Microelettronica e Microsistemi - IMM
OPTICAL MODULATION; CARRIER DEPLETION; SILICON; OPTOELECTRONICS; TRANSISTORS
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/46421
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