Polycrystalline diamond detectors with energy resolving capability of the impinging beam were realized and tested by using a miniature pyroelectric x-ray pulse generator. Microstrip structures were defined by photolithography aimed to reduce parasitic capacitances and to perform characterization measurements in a sandwich configuration. Leakage currents as low as 20 pA at 500 V were measured on a 270 mu m thick device. Pulse height distributions were carried out around Ta L alpha (8.14 keV) and Cu K alpha (8.05 keV) characteristic lines of the source. Energy resolution at 200 V was found equal to 9% with an increase to 11% at 500 V. When the bias was increased to the maximum voltage the sample shows an Ohmic behavior.
X-ray diamond detectors with energy resolution
Conte, G.
;Girolami, M.;
2007
Abstract
Polycrystalline diamond detectors with energy resolving capability of the impinging beam were realized and tested by using a miniature pyroelectric x-ray pulse generator. Microstrip structures were defined by photolithography aimed to reduce parasitic capacitances and to perform characterization measurements in a sandwich configuration. Leakage currents as low as 20 pA at 500 V were measured on a 270 mu m thick device. Pulse height distributions were carried out around Ta L alpha (8.14 keV) and Cu K alpha (8.05 keV) characteristic lines of the source. Energy resolution at 200 V was found equal to 9% with an increase to 11% at 500 V. When the bias was increased to the maximum voltage the sample shows an Ohmic behavior.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
