One-and two-dimensional detector arrays were realized on 270 μm thick 10×10 mm2 CVD-diamond samples. The high resistivity value of diamond specimens in the dark allowed the realization of pixel-detectors based on a sandwich contact structure able to work in a photoconductive mode. Each pixel photocurrent was conditioned by a dedicated readout electronics composed by a high sensitive integrator and a Σ-Δ ADC converter. The overall 500 μs conversion time afforded a data acquisition rate up to 2 kSPS. The fast photoresponse of the diamond specimen in the nanosecond time regime allowed to use the proposed device for excimer-laser beam diagnostics. Moreover, the diamond solar-blindness would guarantee high performance of devices as UV beam profile meters also under high intensity background illumination. © 2008 IEEE.
CVD-diamond detectors for real-time beam profile measurements
Girolami M.;Allegrini P.;Conte G.;
2008
Abstract
One-and two-dimensional detector arrays were realized on 270 μm thick 10×10 mm2 CVD-diamond samples. The high resistivity value of diamond specimens in the dark allowed the realization of pixel-detectors based on a sandwich contact structure able to work in a photoconductive mode. Each pixel photocurrent was conditioned by a dedicated readout electronics composed by a high sensitive integrator and a Σ-Δ ADC converter. The overall 500 μs conversion time afforded a data acquisition rate up to 2 kSPS. The fast photoresponse of the diamond specimen in the nanosecond time regime allowed to use the proposed device for excimer-laser beam diagnostics. Moreover, the diamond solar-blindness would guarantee high performance of devices as UV beam profile meters also under high intensity background illumination. © 2008 IEEE.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
