The authors analyze the feasibility of laser action in erbium-doped silicon devices. The recent experimental results on spontaneous light emission at 1.54 mum from erbium-doped silicon diodes and theoretical calculation on Bragg grating technology are used to evaluate the best scenario performances. The effects of processes-induced errors on the threshold conditions are taken into account. They show that laser action in the Er : Si system is feasible.

Feasibility analysis of laser action in erbium doped silicon waveguides

S Libertino;G Coppola;
2000

Abstract

The authors analyze the feasibility of laser action in erbium-doped silicon devices. The recent experimental results on spontaneous light emission at 1.54 mum from erbium-doped silicon diodes and theoretical calculation on Bragg grating technology are used to evaluate the best scenario performances. The effects of processes-induced errors on the threshold conditions are taken into account. They show that laser action in the Er : Si system is feasible.
2000
Istituto per la Microelettronica e Microsistemi - IMM
Inglese
36
10
1206
1213
8
Sì, ma tipo non specificato
Bragg gratings
DBR
semiconductor laser
Si-based erbium laser
4
info:eu-repo/semantics/article
262
Coffa, S; Libertino, S; Coppola, G; Cutolo, A
01 Contributo su Rivista::01.01 Articolo in rivista
none
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/4850
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