The quality and the characteristics of the fabricated films are governed in PVD by numerous parameters, such as the deposition rate, substrate temperature, sub-strate materials and deposition atmosphere. In this chapter, we will first give a quick hint on the main PVD techniques and, then, a more detailed vision of the sputtering process without losing the generality of the presentation. Chapter Contents: • 7.1 Introduction • 7.2 Thermal processes • 7.2.1 Vacuum evaporation • 7.2.2 Pulsed laser deposition • 7.2.3 Molecular beam epitaxy • 7.3 Sputtering • 7.3.1 DC sputtering • 7.3.1.1 Cathode and anode sheaths • 7.3.1.2 DC discharge model • 7.3.2 RF sputtering • 7.3.2.1 RF discharge model • 7.3.2.2 Matching network • 7.3.2.3 Magnetron • 7.3.2.4 Control system of the thickness • 7.4 Conclusions • Acknowledgements • References.

Thin-film deposition: Physical techniques

Chiasera A.
2021

Abstract

The quality and the characteristics of the fabricated films are governed in PVD by numerous parameters, such as the deposition rate, substrate temperature, sub-strate materials and deposition atmosphere. In this chapter, we will first give a quick hint on the main PVD techniques and, then, a more detailed vision of the sputtering process without losing the generality of the presentation. Chapter Contents: • 7.1 Introduction • 7.2 Thermal processes • 7.2.1 Vacuum evaporation • 7.2.2 Pulsed laser deposition • 7.2.3 Molecular beam epitaxy • 7.3 Sputtering • 7.3.1 DC sputtering • 7.3.1.1 Cathode and anode sheaths • 7.3.1.2 DC discharge model • 7.3.2 RF sputtering • 7.3.2.1 RF discharge model • 7.3.2.2 Matching network • 7.3.2.3 Magnetron • 7.3.2.4 Control system of the thickness • 7.4 Conclusions • Acknowledgements • References.
2021
Istituto di fotonica e nanotecnologie - IFN - Sede Secondaria Povo (Trento)
Atmospheric deposition
PVD techniques
Sputter deposition
Sputtering process
Substrate temperature
Substrates
Thin films
Thin-film deposition
Vacuum deposition
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/486463
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