Automatic Operation of Conventional and Innovative Hardware for Electron Microscopy

New developments in TEM instrumentation and methodology have improved quantitative and high-throughput analysis together with sub-Angstrom spatial resolution, meV energy resolution and femtosecond temporal resolution. Artificial Intelligence (AI) has clearly demonstrated its ability to automate a variety of complex systems ranging from large in- dustrial machines, through vehicles, to small appliances in our homes. Automated control of instruments based on AI, promises to change the way in which electron microscopy is performed, facilitating the preparation of experiments and appears as a natural solution to this problem. Building on these results, we will explore if AI can be exploit to beat traditional methods and autonomously govern the micro- scopes in more complex experimental situations.