Atomic force microscopy (AFM) and scanning probe microscopy (SPM) were used to study the surface topography of electrodeposited pure nickel with different grain sizes from ultra-fine to nanoscale level. Such technique, coupled with nanoindentation and nanoscratch experiments allowed to map the nanotribomechanism acting on the same pure metal with different mechanical and topographical properties.

Tribomechanisms of pure electrodeposited Ni at ultra-fine and nanoscale level

Prete P
2010

Abstract

Atomic force microscopy (AFM) and scanning probe microscopy (SPM) were used to study the surface topography of electrodeposited pure nickel with different grain sizes from ultra-fine to nanoscale level. Such technique, coupled with nanoindentation and nanoscratch experiments allowed to map the nanotribomechanism acting on the same pure metal with different mechanical and topographical properties.
2010
Istituto per la Microelettronica e Microsistemi - IMM
Nanocrystalline materials
AFM
Nanoindentation
Nanoscratch
Wear
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/50564
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