Electro optical absorption in hydrogenated amorphous silicon (alpha-Si:H)-amorphous silicon carbonitride (alpha-SiCxNy) multilayers have been studied in three different planar multistacks waveguides. The waveguides were realized by plasma enhanced chemical vapour deposition (PECVD), a technology compatible with the standard microelectronic processes. Light absorption is induced at lambda = 1.55 mu m through the application of an electric field which induces free carrier accumulation across the multiple insulator/semiconductor device structure. The experimental performances have been compared to those obtained through calculations using combined two-dimensional (2-D) optical and electrical simulations.

Electro-optically induced absorption in alpha-Si:H/alpha-SiCN waveguiding multistacks

Della Corte FG;Summonte C
2010

Abstract

Electro optical absorption in hydrogenated amorphous silicon (alpha-Si:H)-amorphous silicon carbonitride (alpha-SiCxNy) multilayers have been studied in three different planar multistacks waveguides. The waveguides were realized by plasma enhanced chemical vapour deposition (PECVD), a technology compatible with the standard microelectronic processes. Light absorption is induced at lambda = 1.55 mu m through the application of an electric field which induces free carrier accumulation across the multiple insulator/semiconductor device structure. The experimental performances have been compared to those obtained through calculations using combined two-dimensional (2-D) optical and electrical simulations.
2010
Istituto per la Microelettronica e Microsistemi - IMM
amorphous silicon
integrated optics
silicon opto-electronics
electro-optics
free carrier absorption
waveguides
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/50597
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