Ultrafast field-resolved multi-THz spectroscopy on the sub-nanoparticle scale

Terahertz spectroscopy plays a key role in understanding ultrafast carrier dynamics in nanomaterials. Diffraction, however, limits time-resolved terahertz spectroscopy to ensemble measurements. By combining time-resolved terahertz spectroscopy in the multi-terahertz range with scattering-type near-field scanning optical microscopy, we show that we can directly trace ultrafast local carrier dynamics in single nanoparticles with sub-cycle temporal resolution (10 fs). Our microscope provides both 10 nm lateral resolution and tomographic sensitivity, allowing us to observe the ultrafast build-up of a local surface depletion layer in an InAs nanowire.