This paper is devoted to the identification of doping profiles in the stationary drift-diffusion equations modelling carrier and charge transport in semiconductor devices. We develop a framework for these inverse doping problems with different possible measurements and discuss mathematical properties of the inverse problem, such as the identifiability and the type of ill-posedness.

Identification of doping profiles in semiconductor devices

Pietra P
2001

Abstract

This paper is devoted to the identification of doping profiles in the stationary drift-diffusion equations modelling carrier and charge transport in semiconductor devices. We develop a framework for these inverse doping problems with different possible measurements and discuss mathematical properties of the inverse problem, such as the identifiability and the type of ill-posedness.
2001
Istituto di Matematica Applicata e Tecnologie Informatiche - IMATI -
Inverse conductivity problem
ill-posed problems
boundary-value problem
2 dimensions
convergence analysis
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/51441
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