We analyze the voltage-current (V-I) characteristics of the YBCO films grown above the CeO2/NiO/Ni89V11 structure to study the dissipative mechanisms limiting the critical current in these structures. The analysis is performed on the shape of the V-I characteristics, emphasizing the voltage behavior as a function of the bias current. The complex behavior of the fluxon dynamics is described in connection to the reduced pinning force measured on the YBCO films grown on these metallic flexible substrates. © 2001 Elsevier Science B.V.
Voltage current analysis in YBa2Cu3O7-δ/CeO2/NiO/ Ni89V11 structure
De Santis A.;Grimaldi G.;Gambardella U.;Pace S.;
2001
Abstract
We analyze the voltage-current (V-I) characteristics of the YBCO films grown above the CeO2/NiO/Ni89V11 structure to study the dissipative mechanisms limiting the critical current in these structures. The analysis is performed on the shape of the V-I characteristics, emphasizing the voltage behavior as a function of the bias current. The complex behavior of the fluxon dynamics is described in connection to the reduced pinning force measured on the YBCO films grown on these metallic flexible substrates. © 2001 Elsevier Science B.V.File in questo prodotto:
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