In astrophysics, several key questions in the hard X- /soft Gamma-ray range (>100 keV) require sensitivity and angular resolution that are hardly achievable with current technologies. Therefore, a new kind of instrument able to focus hard X and gamma-rays is essential. Broad band Laue lenses seem to be the only solution to fulfil these requirements, significantly improving the sensitivity and angular resolution of the X-/gamma-ray telescopes. This type of high-energy optics will require highly performing focal plane detectors in terms of detection efficiency, spatial resolution, and spectroscopy. This paper presents the results obtained in the project “Technological Readiness Increase for Laue Lenses (TRILL)” framework using a Caliste-HD detector module. This detector is a pixel spectrometer developed at CEA (Commissariat à Energie Atomique, Saclay, France). It is used to acquire spectroscopic images of the focal spot produced by Laue Lens bent crystals under a hard X-ray beam at the LARIX facility (University of Ferrara, Italy).

CdTe Spectroscopic-Imager Measurements with Bent Crystals for Broad Band Laue Lenses

C. Ferrari
Membro del Collaboration Group
;
2024

Abstract

In astrophysics, several key questions in the hard X- /soft Gamma-ray range (>100 keV) require sensitivity and angular resolution that are hardly achievable with current technologies. Therefore, a new kind of instrument able to focus hard X and gamma-rays is essential. Broad band Laue lenses seem to be the only solution to fulfil these requirements, significantly improving the sensitivity and angular resolution of the X-/gamma-ray telescopes. This type of high-energy optics will require highly performing focal plane detectors in terms of detection efficiency, spatial resolution, and spectroscopy. This paper presents the results obtained in the project “Technological Readiness Increase for Laue Lenses (TRILL)” framework using a Caliste-HD detector module. This detector is a pixel spectrometer developed at CEA (Commissariat à Energie Atomique, Saclay, France). It is used to acquire spectroscopic images of the focal spot produced by Laue Lens bent crystals under a hard X-ray beam at the LARIX facility (University of Ferrara, Italy).
2024
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
978-1-6654-8872-3
CdTe Spectroscopic-Imager, Bent Crystals, Broad Band Laue Lenses
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/516242
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