A through-wall imaging problem for a 3-D geometry is considered. Scatterers are located beyond a wall represented by a dielectric slab whose features are unknown or known with some degree of uncertainty. A two-step imaging procedure is presented. First, the thickness and the dielectric permittivity of the wall are estimated by a simple procedure which takes into account that actual measurements concern the total scattered field (i.e., the field reflected by the wall plus the one scattered by the obscured scatterers). Then, the problem is cast as a linear inverse scattering problem and solved by means of a truncated-singular value decomposition algorithm. In particular, a 2-D sliced approach is employed to obtain the 3-D scene. Numerical examples are shown to assess the effectiveness of the reconstruction procedure.
Three-Dimensional Through-Wall Imaging Under Ambiguous Wall Parameters
Soldovieri F;
2009
Abstract
A through-wall imaging problem for a 3-D geometry is considered. Scatterers are located beyond a wall represented by a dielectric slab whose features are unknown or known with some degree of uncertainty. A two-step imaging procedure is presented. First, the thickness and the dielectric permittivity of the wall are estimated by a simple procedure which takes into account that actual measurements concern the total scattered field (i.e., the field reflected by the wall plus the one scattered by the obscured scatterers). Then, the problem is cast as a linear inverse scattering problem and solved by means of a truncated-singular value decomposition algorithm. In particular, a 2-D sliced approach is employed to obtain the 3-D scene. Numerical examples are shown to assess the effectiveness of the reconstruction procedure.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
