This paper studies the thermal instability phenomenon of irradiated HV power MOSFET devices working in Linear Zone operating conditions and compares their electro-thermal behaviour with standard products. Experimental results show that irradiated are more thermal instable than standard devices, thus, they should be used carefully in this particular operating conditions. © VDE VERLAG GMBH · Berlin · Offenbach.
Irradiated HV power MOSFETs working in Linear Zone: A comparison of electro-thermal behavior with standard HV products
Consentino G.
2013
Abstract
This paper studies the thermal instability phenomenon of irradiated HV power MOSFET devices working in Linear Zone operating conditions and compares their electro-thermal behaviour with standard products. Experimental results show that irradiated are more thermal instable than standard devices, thus, they should be used carefully in this particular operating conditions. © VDE VERLAG GMBH · Berlin · Offenbach.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
