This paper studies and analyzes the integrated temperature sensor of a LV power MOSFET SAFeFETTM device from STMicroelectronics (STZ150NF55T). The paper also shows a typical example of an application where this kind of device can be considered: a fan controller electrical system. For this case, the paper suggests a design example of how achieve a device shutdown event if the junction temperature reaches its maximum guaranteed value. Finally, an evaluation of the error in the junction temperature reading under different thermal conditions is performed to complete the analysis

Power MOSFET with integrated poly-silicondiode to monitor junction temperature, with simplified external electrical shutdown circuit to prevent thermal runaway

Giuseppe Consentino;
2009

Abstract

This paper studies and analyzes the integrated temperature sensor of a LV power MOSFET SAFeFETTM device from STMicroelectronics (STZ150NF55T). The paper also shows a typical example of an application where this kind of device can be considered: a fan controller electrical system. For this case, the paper suggests a design example of how achieve a device shutdown event if the junction temperature reaches its maximum guaranteed value. Finally, an evaluation of the error in the junction temperature reading under different thermal conditions is performed to complete the analysis
2009
Istituto per la Microelettronica e Microsistemi - IMM
978-3-8007-3158-9
Power MOSFETs
Intrinsic Diode
temperature control
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/520547
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ente

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? ND
social impact