The thermo-optic coe.cient (TOC) of hydrogenated amorphous silicon (a- Si:H) has been measured in the temperature range 30200 °C, at the communication wavelength of 1.55 microns. The experimental data have been fitted using a single oscillator model that takes into account the shape of epsolion2-spectrum of the amorphous semiconductor. The extracted parameters signicantly extend, and are consistent with, the few data reported in the literature. An interesting analogy with crystalline silicon (c-Si) is also found and discussed.
Measurement of the thermo-optic coefficient of a-Si : H at the wavelength of 1500 nm from room temperature to 200 degrees C
2002
Abstract
The thermo-optic coe.cient (TOC) of hydrogenated amorphous silicon (a- Si:H) has been measured in the temperature range 30200 °C, at the communication wavelength of 1.55 microns. The experimental data have been fitted using a single oscillator model that takes into account the shape of epsolion2-spectrum of the amorphous semiconductor. The extracted parameters signicantly extend, and are consistent with, the few data reported in the literature. An interesting analogy with crystalline silicon (c-Si) is also found and discussed.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
