A high-intensity two-crystal four-220-reflection germanium monochromator is proposed for high-resolution X-ray diffraction. The beam divergence in the diffraction plane and the fractional wavelength band-pass are smaller by 40% than those of the well known Bartels monochromator, while the flux collected from the source is larger by a factor of five.
X-ray monochromator combining high resolution with high intensity
2002
Abstract
A high-intensity two-crystal four-220-reflection germanium monochromator is proposed for high-resolution X-ray diffraction. The beam divergence in the diffraction plane and the fractional wavelength band-pass are smaller by 40% than those of the well known Bartels monochromator, while the flux collected from the source is larger by a factor of five.File in questo prodotto:
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