We present a-Al2O3 XAS, XES and RIXS measurements across the Al L2/L3 edges at about 79 eV excitation energy. In the emission spectra, we identify two fluorescence peaks, corresponding to electronic transitions into the 2p core hole from mixed states of Al 3s and Al 3d character, both mixed with O 2p orbitals. Even if the XAS spectrum shows more than one resonance, surprisingly only one clear RIXS signal with energy loss equal to 10.7 eV is present in the data. Nevertheless, this allows us to tentatively extract from the measured high-resolution data the linewidths for fluorescence and RIXS transitions, with the latter being almost a factor of two smaller than the former.

Extending Resonant Inelastic X-ray Scattering to Extreme Ultraviolet

Coreno M.;Orlando S.;de Simone M.;Miotti P.;Frassetto F.;Poletto L.;Bleiner D.;
2025

Abstract

We present a-Al2O3 XAS, XES and RIXS measurements across the Al L2/L3 edges at about 79 eV excitation energy. In the emission spectra, we identify two fluorescence peaks, corresponding to electronic transitions into the 2p core hole from mixed states of Al 3s and Al 3d character, both mixed with O 2p orbitals. Even if the XAS spectrum shows more than one resonance, surprisingly only one clear RIXS signal with energy loss equal to 10.7 eV is present in the data. Nevertheless, this allows us to tentatively extract from the measured high-resolution data the linewidths for fluorescence and RIXS transitions, with the latter being almost a factor of two smaller than the former.
2025
Istituto di Struttura della Materia - ISM - Sede Secondaria Trieste
Istituto di Struttura della Materia - ISM - Sede Secondaria Tito Scalo
Istituto di fotonica e nanotecnologie - IFN - Sede Secondaria Padova
Istituto Officina dei Materiali - IOM -
EUV spectroscopy
Synchrotron experiments
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/544941
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