We investigate the activation yield and optical properties of the negatively charged nitrogen-vacancy (NV (-)) and silicon-vacancy (SiV (-)) centers in single-crystal diamonds, focusing on the effect of proton (p) and carbon-ion (C) irradiation on their formation. The samples, either nitrogen-rich or silicon-implanted, are grown by chemical vapor deposition or high pressure-high temperature synthesis. They are irradiated over three orders of magnitude in fluence, up to similar to 10(14)C/cm(2) or similar to 10(16) p/cm(2), generating up to similar to 10(4) ppm of extra vacancies at the end-of-range. Following thermal annealing at 1150 degrees C for 1 h, we characterize the samples using time-resolved spectroscopy, optical spectroscopy, and optically detected magnetic resonance. The optical properties of the NV (-) and SiV- centers remain stable even at vacancy concentrations of similar to 10(3)-10(4) ppm. At the same time, the activation yield of substitutional nitrogen and (primarily) interstitial silicon increases significantly with vacancy density, from below 2 % to approximately 15-20 % for both centers. A statistical model of defect dynamics during annealing accounts for these results, showing that the activation yield follows a logarithmic dependence on local vacancy concentration-extending over three decades for NV (-) and two for SiV (-).
Enhanced activation yield of nitrogen-vacancy and silicon-vacancy diamond color centers by proton and carbon irradiation
Lagomarsino S.
;Markesevic N.;Rashid Z.;Bianchini G.;Massi M.;Sciortino S.;Corsi C.;Bellini M.;Fabbri N.;Agio M.
2025
Abstract
We investigate the activation yield and optical properties of the negatively charged nitrogen-vacancy (NV (-)) and silicon-vacancy (SiV (-)) centers in single-crystal diamonds, focusing on the effect of proton (p) and carbon-ion (C) irradiation on their formation. The samples, either nitrogen-rich or silicon-implanted, are grown by chemical vapor deposition or high pressure-high temperature synthesis. They are irradiated over three orders of magnitude in fluence, up to similar to 10(14)C/cm(2) or similar to 10(16) p/cm(2), generating up to similar to 10(4) ppm of extra vacancies at the end-of-range. Following thermal annealing at 1150 degrees C for 1 h, we characterize the samples using time-resolved spectroscopy, optical spectroscopy, and optically detected magnetic resonance. The optical properties of the NV (-) and SiV- centers remain stable even at vacancy concentrations of similar to 10(3)-10(4) ppm. At the same time, the activation yield of substitutional nitrogen and (primarily) interstitial silicon increases significantly with vacancy density, from below 2 % to approximately 15-20 % for both centers. A statistical model of defect dynamics during annealing accounts for these results, showing that the activation yield follows a logarithmic dependence on local vacancy concentration-extending over three decades for NV (-) and two for SiV (-).| File | Dimensione | Formato | |
|---|---|---|---|
|
Diam.Relat.Mater.v158p112632.pdf
accesso aperto
Tipologia:
Versione Editoriale (PDF)
Licenza:
Creative commons
Dimensione
3.32 MB
Formato
Adobe PDF
|
3.32 MB | Adobe PDF | Visualizza/Apri |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.


