In this article an incorrect version of Fig. 19 appeared as shown below, under the heading INCORRECT. It should have appeared as shown further below, under the heading CORRECT. The original article has been corrected. Normalized Confusion Matrix for: (i) Yolov8 – missing hole dataset, (ii) Yolov8 – short dataset, (iii) Detectron2 – missing hole dataset, and (iv) Detectron2 – short dataset Normalized Confusion Matrix for: (i) Yolov8 – missing hole dataset, (ii) Yolov8 – short dataset, (iii) Detectron2 – missing hole dataset, and (iv) Detectron2 – short dataset

Correction: Application of Mask R-CNN and YOLOv8 algorithms for defect detection in printed circuit board manufacturing

Fontana, Gianmauro;
2025

Abstract

In this article an incorrect version of Fig. 19 appeared as shown below, under the heading INCORRECT. It should have appeared as shown further below, under the heading CORRECT. The original article has been corrected. Normalized Confusion Matrix for: (i) Yolov8 – missing hole dataset, (ii) Yolov8 – short dataset, (iii) Detectron2 – missing hole dataset, and (iv) Detectron2 – short dataset Normalized Confusion Matrix for: (i) Yolov8 – missing hole dataset, (ii) Yolov8 – short dataset, (iii) Detectron2 – missing hole dataset, and (iv) Detectron2 – short dataset
2025
Istituto di Sistemi e Tecnologie Industriali Intelligenti per il Manifatturiero Avanzato - STIIMA (ex ITIA)
Printed circuit board manufacturing
Printed circuit board defect detection
Automated optical inspection
Deep learning
Mask R-CNN
YOLOv8
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/563643
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