This study exploits a poling method based on the use of the electron beam in scanning electron microscopy (SEM) to fully activate massive porous and dense piezoelectric ceramics, which are difficult to polarize in high electric fields. Key parameters such as scan speed, exposure time, specimen thickness, and the presence of sputtered electrodes, were analyzed for their effect on the poling process, with d33 coefficient measurements used for evaluation. SEM-induced poling activated both dense (410 pC/N) and porous (500 pC/N) lead-free BCTZ ceramics, outperforming traditional oil-based poling (d33 < 350 pC/N). This SEM-induced method offers exceptional flexibility and precision, enabling customizable poling patterns without the need for surface electrodes.

Breakthroughs in scanning electron microscopy poling of massive dense and porous lead-free piezoelectric ceramics

Galizia P.
Primo
;
Baldisserri C.;Mercadelli E.
Ultimo
2025

Abstract

This study exploits a poling method based on the use of the electron beam in scanning electron microscopy (SEM) to fully activate massive porous and dense piezoelectric ceramics, which are difficult to polarize in high electric fields. Key parameters such as scan speed, exposure time, specimen thickness, and the presence of sputtered electrodes, were analyzed for their effect on the poling process, with d33 coefficient measurements used for evaluation. SEM-induced poling activated both dense (410 pC/N) and porous (500 pC/N) lead-free BCTZ ceramics, outperforming traditional oil-based poling (d33 < 350 pC/N). This SEM-induced method offers exceptional flexibility and precision, enabling customizable poling patterns without the need for surface electrodes.
2025
Istituto di Scienza, Tecnologia e Sostenibilità per lo Sviluppo dei Materiali Ceramici - ISSMC (ex ISTEC)
Istituto di Struttura della Materia - ISM - Sede Roma Tor Vergata
Electron beam method
Ferroelectric ceramics
Piezoelectric ceramics
Poling
Scanning electron microscopy (SEM)
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/579842
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ente

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 2
  • ???jsp.display-item.citation.isi??? ND
social impact