An Introductory Overview of Various Typical Lead-Free Solders for TSV Technology

As semiconductor packaging technologies face limitations, through-silicon via (TSV) technology has emerged as a key solution to extending Moore’s law by achieving high-density, high-performance microelectronics. TSV technology enables enhanced wiring density, signal speed, and power efficiency, and offers significant advantages over traditional wire-bonding techniques. However, achieving fine-pitch and high-density interconnects remains a challenge. Solder flip-chip microbumps have demonstrated their potential to improve interconnect reliability and performance. However, the environmental impact of lead-based solders necessitates a shift to lead-free alternatives. This review highlights the transition from Sn-Pb solders to lead-free options, such as Sn-Ag, Sn-Cu, Sn-Ag-Cu, Sn-Zn, and Bi- or In-based alloys, driven by regulatory and environmental considerations. Although lead-free solders address environmental concerns, their higher melting points pose challenges such as thermal stress and chip warping, which affect device reliability. To overcome these challenges, the development of low-melting-point solder alloys has gained momentum. This study examines advancements in low-temperature solder technologies and evaluates their potential for enhancing device reliability by mitigating thermal stress and ensuring long-term stability.