omplexes formed by H and the isoelectronic impurity N in GaAsi_j,N,, alloys have been widely investigated to explain the significant effects of N on the host material properties and their passivation by H. However, available results still present a quite puzzling picture, none of the models proposed by theory for the N-H complexes being able to account for all of the experimental findings. An N-H| complex first proposed by theory was challenged by infrared results. A following C2V complex has been challenged by a recent high resolution x-ray diffraction and photoluminescence spectroscopy study questioning the structural effects of this complex. In the present study, we show that a peculiar character of the H interaction with an isoelectronic impurity can induce the formation of novel, multiple-H complexes. In turn, one of this complexes can account for the H structural effects recently observed, thus reconciling theory and experiment

Multiple-hydrogen complexes in dilute nitride alloys.

Amore Bonapasta A;Filippone F;Mattioli G
2007

Abstract

omplexes formed by H and the isoelectronic impurity N in GaAsi_j,N,, alloys have been widely investigated to explain the significant effects of N on the host material properties and their passivation by H. However, available results still present a quite puzzling picture, none of the models proposed by theory for the N-H complexes being able to account for all of the experimental findings. An N-H| complex first proposed by theory was challenged by infrared results. A following C2V complex has been challenged by a recent high resolution x-ray diffraction and photoluminescence spectroscopy study questioning the structural effects of this complex. In the present study, we show that a peculiar character of the H interaction with an isoelectronic impurity can induce the formation of novel, multiple-H complexes. In turn, one of this complexes can account for the H structural effects recently observed, thus reconciling theory and experiment
2007
Istituto di Struttura della Materia - ISM - Sede Roma Tor Vergata
hydrogen
isoelectronic impurities
GaAsN alloys
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/62861
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