SuperAmpelo is a program designed to help Vitis germplasm cataloguing. The software, developed in Microsoft Visual Studio.Net and compatible also with Microsoft Access 2000 Data Base, allows to measure leaves, clusters, berries, and seeds, and to record the main descriptive ampelographic characters. The coordinates of the leaf relevant points for biometric descriptions are obtained from different image sources (scanner, digital camera, and digitizer) using mouse or optical pen. The points obtained allow building the cultivar leaf standard profile through the leaf mean coordinates computation for every accession, and the automatic compiling of the biometric OIV descriptors. Distances, angles, ratios, and synthetic data are structured in folders for a better data view and management; the standard deviation is calculated for every biometric parameter. The descriptive ampelographic data of the leaf, visually collected by the operator, are recorded in a curtain control window ready on purpose for each OIV descriptor so that the appropriate expression level of each descriptor can easily be selected. The program shows the most frequent value among those recorded on the different leaves of every accession and it also includes a leaf shape identification system based on leaf size. A preliminary test carried on a sample of 1,100 leaves proved the program capacity for the correct assignment of leaf shape was 81% of the total leaves analysed.
SuperAmpelo, a software for ampelometric and ampelographic descriptions in Vitis
Schneider;
2009
Abstract
SuperAmpelo is a program designed to help Vitis germplasm cataloguing. The software, developed in Microsoft Visual Studio.Net and compatible also with Microsoft Access 2000 Data Base, allows to measure leaves, clusters, berries, and seeds, and to record the main descriptive ampelographic characters. The coordinates of the leaf relevant points for biometric descriptions are obtained from different image sources (scanner, digital camera, and digitizer) using mouse or optical pen. The points obtained allow building the cultivar leaf standard profile through the leaf mean coordinates computation for every accession, and the automatic compiling of the biometric OIV descriptors. Distances, angles, ratios, and synthetic data are structured in folders for a better data view and management; the standard deviation is calculated for every biometric parameter. The descriptive ampelographic data of the leaf, visually collected by the operator, are recorded in a curtain control window ready on purpose for each OIV descriptor so that the appropriate expression level of each descriptor can easily be selected. The program shows the most frequent value among those recorded on the different leaves of every accession and it also includes a leaf shape identification system based on leaf size. A preliminary test carried on a sample of 1,100 leaves proved the program capacity for the correct assignment of leaf shape was 81% of the total leaves analysed.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
