We studied the passivation effect of plasma deposited intrinsic and doped hydrogenated amorphous silicon layers on industrial grade, n-type, 1 ?cm multicrystalline silicon, aimed at the fabrication of Heterojunction (HJ) solar cells based on such material. The investigated variables include the process temperature, hydrogen dilution of silane during the intrinsic layer deposition, and passivating layer thickness. The structure of the passivating layers was analysed by optical measurements. Surface photovoltage and quasi-steady state photoconductance were used to characterize untreated and treated wafers. Thin a-Si:H layers exhibited the best passivating performance.

Surface passivation of multi-Si for heterojunction solar cells

Canino M;Summonte C;
2008

Abstract

We studied the passivation effect of plasma deposited intrinsic and doped hydrogenated amorphous silicon layers on industrial grade, n-type, 1 ?cm multicrystalline silicon, aimed at the fabrication of Heterojunction (HJ) solar cells based on such material. The investigated variables include the process temperature, hydrogen dilution of silane during the intrinsic layer deposition, and passivating layer thickness. The structure of the passivating layers was analysed by optical measurements. Surface photovoltage and quasi-steady state photoconductance were used to characterize untreated and treated wafers. Thin a-Si:H layers exhibited the best passivating performance.
2008
Istituto per la Microelettronica e Microsistemi - IMM
3-936338-24-8
Heterojunction
Passivation
Multicrystalline-Silicon
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/69321
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