Remarkable advances in semiconductor technology as long as improvements in device design resulted in today's Silicon Single Photon Avalanche Diodes (SPADs) that are widely used in many demanding applications thanks to their excellent performance. However a lot of work is still be done in order to simultaneously meet three requirements crucial in a large number of applications, i.e. high Photon Detection Efficiency (PDE), good timing resolution and suitability for the fabrication of arrays. We will report on our advances on the development of a new planar silicon SPAD with high photon detection efficiency (PDE) and good photon timing resolution. A thick epitaxial layer allows for the absorption of a significant fraction of photons even at the longer wavelengths, while a suitable electric field profile limits the breakdown voltage value and the timing jitter; biased guard rings are also included to prevent edge breakdown. Preliminary results show that the new devices can attain a PDE as high as 30% at a wavelength of 800nm while keeping photon detection jitter below 100ps.

Planar silicon SPADs with improved photon detection efficiency

Maccagnani P;
2011

Abstract

Remarkable advances in semiconductor technology as long as improvements in device design resulted in today's Silicon Single Photon Avalanche Diodes (SPADs) that are widely used in many demanding applications thanks to their excellent performance. However a lot of work is still be done in order to simultaneously meet three requirements crucial in a large number of applications, i.e. high Photon Detection Efficiency (PDE), good timing resolution and suitability for the fabrication of arrays. We will report on our advances on the development of a new planar silicon SPAD with high photon detection efficiency (PDE) and good photon timing resolution. A thick epitaxial layer allows for the absorption of a significant fraction of photons even at the longer wavelengths, while a suitable electric field profile limits the breakdown voltage value and the timing jitter; biased guard rings are also included to prevent edge breakdown. Preliminary results show that the new devices can attain a PDE as high as 30% at a wavelength of 800nm while keeping photon detection jitter below 100ps.
2011
Istituto per la Microelettronica e Microsistemi - IMM
Inglese
Razeghi, M, Sudharsanan, R, Brown, GJ
Proceedings of SPIE QUANTUM SENSING AND NANOPHOTONIC DEVICES VIII
Conference on Quantum Sensing and Nanophotonic Devices VIII
978-0-81948-482-6
Sì, ma tipo non specificato
JAN 23-27, 2011
San Francisco
Single-Photon Avalanche Diode (SPAD)
Photon Detection Efficiency (PDE)
Time Correlated Single Photon Counting (TCSPC)
Enhanced Photon Detection Efficiency
1
none
Gulinatti A; Panzeri F; Rech I; Maccagnani P; Ghioni M; Cova SD
273
info:eu-repo/semantics/conferenceObject
04 Contributo in convegno::04.01 Contributo in Atti di convegno
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/69372
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