In this work we present a detailed optical characterization of InGaN-based multiple QWs performed by combining time-resolved and time-integrated photoluminescence and cathodoluminescence techniques. The experimental results are well reproduced in the framework of a theoretical model where a self-consistent solution of Schrodinger-Poisson equations is coupled to a rate equation model to account for time-dependent effects of charge re-arrangement to determine the electronic states in the nanostructure. The theoretical model is demonstrated to describe in a common scenario either time-integrated and time dependent photoluminescence and finally cathodoluminescence, for samples having different well widths (i.e. different internal polarization fields). We demonstrate that, provided the correct material parameters of the InGaN/GaN alloys are considered in the model, including the bowing of the polarization fields and Gap, the same theoretical approach previously reported for AlGaN/GaN systems applies.

Investigation of the recombination dynamics in low in-content InGaN MQWs by means of cathodoluminescence and photo-luminescence excitation

Di Carlo A;Rossi F;Armani N;Ferrari C;Salviati G;Lazzarini L;Grillo V
2005

Abstract

In this work we present a detailed optical characterization of InGaN-based multiple QWs performed by combining time-resolved and time-integrated photoluminescence and cathodoluminescence techniques. The experimental results are well reproduced in the framework of a theoretical model where a self-consistent solution of Schrodinger-Poisson equations is coupled to a rate equation model to account for time-dependent effects of charge re-arrangement to determine the electronic states in the nanostructure. The theoretical model is demonstrated to describe in a common scenario either time-integrated and time dependent photoluminescence and finally cathodoluminescence, for samples having different well widths (i.e. different internal polarization fields). We demonstrate that, provided the correct material parameters of the InGaN/GaN alloys are considered in the model, including the bowing of the polarization fields and Gap, the same theoretical approach previously reported for AlGaN/GaN systems applies.
2005
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
Istituto di Struttura della Materia - ISM - Sede Roma Tor Vergata
NITRIDE ALLOYS, POLARIZATION, BEHAVIOR, FIELDS
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/6974
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