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The paper presents an experimental method useful to characterize a four-port circuit, using a twoport VNA (Vector Network Analyzer). As an example, the method is applied for a coupler. The results obtained by using this method and the expected results obtained by simulation are in good agreement.

On-wafer experimental characterization for a 4-port circuit, using a two-port Vector Network Analyzer

Marcelli R;Bartolucci G
2008

Abstract

The paper presents an experimental method useful to characterize a four-port circuit, using a twoport VNA (Vector Network Analyzer). As an example, the method is applied for a coupler. The results obtained by using this method and the expected results obtained by simulation are in good agreement.
2008
Istituto per la Microelettronica e Microsistemi - IMM
Editors: Dan Dascalu, General Chairman and Adrian Rusu, Technical Program Chair
Proceedings of the International Semiconductor Conference, IEEE CAS 2008
International Semiconductor Conference, IEEE CAS 2008
223
226
4
978-1-4244-2004-9
CAS Office
Bucuresti
ROMANIA
Sì, ma tipo non specificato
October 13 - 15, 2008
Sinaia, Romania
RF MEMS
on-wafer measurements
four-port devices
2
none
Simion S; Sajin G; Marcelli R; Bartolucci G
273
info:eu-repo/semantics/conferenceObject
04 Contributo in convegno::04.01 Contributo in Atti di convegno
04.01 Contributo in Atti di convegno
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/70230
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