This paper reports a rapid electron spin resonance method to assess the dynamical properties of spin-labeled alkyl carboxylate layers, covalently linked onto a porous silicon substrate. IR and X-ray photoelectron spectroscopy analyses complemented the ESR study by proving the successful grafting of the organic radical and coverage of the surface.

Dynamics of a Nitroxide Layer Grafted onto Porous Silicon

Armelao L;
2010

Abstract

This paper reports a rapid electron spin resonance method to assess the dynamical properties of spin-labeled alkyl carboxylate layers, covalently linked onto a porous silicon substrate. IR and X-ray photoelectron spectroscopy analyses complemented the ESR study by proving the successful grafting of the organic radical and coverage of the surface.
2010
Istituto di Scienze e Tecnologie Molecolari - ISTM - Sede Milano
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/72396
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