Semiconductor-doped glasses were investigated by structural analysis and waveguide characterization techniques. Small-angle neutron scattering allowed precise determination of the average size of the microcrystallites; it showed the existence of a volume depleted of semiconductor constituents which surrounds each particle. Waveguides were and non-linear measurements were taken.
Semiconductor doped glasses: structural and waveguide characterization
S Pelli
1991
Abstract
Semiconductor-doped glasses were investigated by structural analysis and waveguide characterization techniques. Small-angle neutron scattering allowed precise determination of the average size of the microcrystallites; it showed the existence of a volume depleted of semiconductor constituents which surrounds each particle. Waveguides were and non-linear measurements were taken.File in questo prodotto:
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