We report on an interferometric technique based on two-dimensional Fourier fringe analysis for measuring the refractive indices and the thermo-optic coefficients of semiconductor-doped glasses suitable for optical waveguide fabrication. The principle of the measurement method is discussed. The thermo-optic coefficients of semiconductor-doped Schott glass filters have been determined in the temperature range 25-85 °C.
Interferometric measurement of the refractive index and the thermo-optic coefficient of semiconductor-doped glasses
S De Nicola;P Ferraro;A Finizio;G Pierattini;S Pelli
1999
Abstract
We report on an interferometric technique based on two-dimensional Fourier fringe analysis for measuring the refractive indices and the thermo-optic coefficients of semiconductor-doped glasses suitable for optical waveguide fabrication. The principle of the measurement method is discussed. The thermo-optic coefficients of semiconductor-doped Schott glass filters have been determined in the temperature range 25-85 °C.File in questo prodotto:
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