CONSENTINO, GIUSEPPE

CONSENTINO, GIUSEPPE  

Istituto per la Microelettronica e Microsistemi - IMM  

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Risultati 1 - 15 di 15 (tempo di esecuzione: 0.022 secondi).
Titolo Data di pubblicazione Autore(i) File
TCAD modeling of bias temperature instabilities in SiC MOSFETs 1-gen-2021 Carangelo, G.; Reggiani, S.; Consentino, G.; Crupi, F.; Meneghesso, G.
A New Effective Methodology for Semiconductor Power Devices HTRB Testing 1-gen-2017 Pace, C.; Hernandez-Ambato, J.; Fragomeni, L.; Consentino, G.; D'Ignoti, A.; Galiano, S.; Grimaldi, A.
Proton Irradiation on SJ HV Power MOSFETs to Realize Fast Diode Devices 1-gen-2014 Consentino, Giuseppe; Bertuglia, Ignazio; Laudani, Michele
A model for avalanche breakdown calculation in low-voltage trench power MOSFET devices 1-gen-2013 Pace, C.; Pierro, S.; Cilia, V.; Consentino, G.
Instrumentation for Innovative Semiconductor Power Devices Reliability Tests 1-gen-2013 Consentino, Giuseppe; Hernandez Ambato, J. L.; De Pasquale, Donatella; Pace, Calogero
Threshold Voltage Thermal Coefficient (TVTC) in Power MOSFETs: Theretical study, measures and simulation 1-gen-2007 Consentino, Giuseppe
A full-bridge solution Enables driving of cold cathode fluorescent lamps 1-gen-2005 Consentino, Giuseppe
Battery Protection Systems Focus 1-gen-2005 Consentino, Giuseppe; Grimaldi, Antonio
Designing CCFL applications using Royer topologies 1-gen-2005 Consentino, Giuseppe
Emergency lighting applications 1-gen-2005 Consentino, Giuseppe
Implementing the application using the Fall-bridge CCFL topology 1-gen-2005 Consentino, Giuseppe
Royer Solution for CCFL 1-gen-2005 Consentino, Giuseppe
SAFE OPERATING LIMITS IN LINEAR MODE IN THE LATEST GENERATION OF LOW VOLTAGE POWER MOSFETS 1-gen-2005 Consentino, Giuseppe; Bazzano, Gaetano
BAUMCHEN WECHSLE DICH – WECHSELRICHTER: EINEXEMPEL ERPROBEN 1-gen-2004 Consentino, Giuseppe; Scollo, Rosario
Thermal instability of low voltage power-MOSFET's 1-gen-2000 Consoli, A.; Gennaro, F.; Testa, A.; Consentino, G.; Frisina, F.; Letor, R.; Magri, A.