statistiche ricercatore

Nome	#
A packaging technique for silicon MEMS strain sensors on steel	2
Arsenic uphill diffusion during shallow junction formation	2
Damage and recovery in doped SOI layers after high energy implantation	1
Damage and recovery in boron doped SOI layers after high energy implantation	1
Fabrication of DETF sensors in SOI technology with submicron air gaps using a maskless line narrowing technique	1
Development of MEMS strain sensors for crack monitoring in ageing civil infrastructures	1
Behaviour of low energy As ions implanted in Si through a thin oxide layer	1
Damage and recovery in arsenic doped silicon after high energy Si+ implantation	1
Fabrication and testing of a high resolution extensometer based on resonant MEMS strain sensors	1
Damage and recovery in doped SOI layers after high energy implantation	1
Damage recovery in boron doped silicon on insulator layers after high energy Si+ implantation	1
Damage and recovery in boron doped silicon on insulator layers after high energy Si+ implantation	1
Carbon-cap for Ohmic Contacts on Ion Implanted 4H-SiC	1
Industrially Scalable Process for Silicon Nanowires for Seebeck Generators	1
A packaging technique for silicon MEMS strain sensors on steel	1
Terascale integration via a redesign of the crossbar based on a vertical arrangement of poly-Si nanowires	1
Nanograin Effects on the Thermoelectric Properties of Poly-Si Nanowires	1
Totale	19

	Totale	Lug	Ago	Sett	Ott	Nov	Dic	Gen	Feb	Mar	Apr	Mag	Giu
2023/2024	19	0	0	0	0	0	0	0	0	0	0	18	1
Totale													19

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