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FERRI, MATTEO

FERRI, MATTEO  

Istituto per la Microelettronica e Microsistemi - IMM  

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Risultati 1 - 20 di 56 (tempo di esecuzione: 0.03 secondi).
Titolo Data di pubblicazione Autore(i) File
A packaging technique for silicon MEMS strain sensors on steel 1-gen-2008 Ferri M; Cristiani S; Kobayashi Y; Soga K;Roncaglia A
A packaging technique for silicon MEMS strain sensors on steel 1-gen-2008 Ferri, M; Cristiani, S; Kobayashi, Y; Soga, K; Roncaglia, A
A packaging technique for silicon MEMS strain sensors on steel 1-gen-2008 Ferri, M; Cristiani, S; Roncaglia, A; Kobayashi, Y; Soga, K.
Arsenic uphill diffusion during shallow junction formation 1-gen-2006 Ferri, M; Solmi, S; Parisini, A; Bersani, M; Giubertoni, D; Barozzi, M
Behaviour of low energy As ions implanted in Si through a thin oxide layer 1-gen-2004 Ferri, M; Parisini, A; Solmi, S; Bersani, M; Giubertoni, D; Barozzi, M
beta-SiC NWs grown on patterned and MEMS silicon substrates 1-gen-2011 Watts, BERNARD ENRICO; Bernard Enrico, E; Attolini, Giovanni; Attolini, Giovanni; Rossi, Francesca; Rossi, Francesca; Bosi, Matteo; Bosi, Matteo; Salviati, Giancarlo; Salviati, Giancarlo; Mancarella, Fulvio; Mancarella, Fulvio; Ferri, Matteo; Bosi, Matteo; Roncaglia, Alberto; Roncaglia, Alberto; Poggi, Antonella; Poggi, Antonella
Boron pile-up phenomena during ultra shallow junction formation 1-gen-2007 Ferri M; Solmi S; Giubertoni D; Bersani M; Hamilton JJ; Kah M; Cowern NEB; Kirkby K; Collart EJH
Carbon-cap for Ohmic Contacts on Ion Implanted 4H-SiC 1-gen-2010 Nipoti R; Mancarella F; Moscatelli F; Rizzoli R; Zampolli S; Ferri M
Challenges and progress toward a silicon-based multi-microring optical network-on-chip 1-gen-2014 Andriolli, Nicola; Cerutti, Isabella; Pintus, Paolo; Scaffardi, Mirco; Marini, D; Montanari Giovanni, Battista; Mancarella, Fulvio; Ferri, Matteo; Balboni, Roberto; Bolognini, Gabriele
Crossbar architecture for tera scale integration 1-gen-2011 Cerofolini GF; Ferri M; Romano E; Suriano F; Veronese GP; Solmi S; Narducci D
Damage and recovery in arsenic doped silicon after high energy Si+ implantation 1-gen-2004 Solmi, S; Ferri, M; Nobili, D; Bianconi, M
Damage and recovery in boron doped silicon on insulator layers after high energy Si+ implantation 1-gen-2006 Ferri, M; Solmi, S; Nobili, D; Armigliato, A
Damage and recovery in boron doped SOI layers after high energy implantation 1-gen-2005 Ferri, M; Solmi, S; Armigliato, A; Nobili, D; Passini, M
Damage and recovery in doped SOI layers after high energy implantation 1-gen-2004 Ferri, M; Solmi, S; Armigliato, A; Bianconi, M; Lulli, G; Nobili, D
Damage and recovery in doped SOI layers after high energy implantation 1-gen-2004 Ferri, M; Solmi, S; Armigliato, A; Bianconi, M; Lulli, G; Nobili, D
Damage recovery in boron doped silicon on insulator layers after high energy Si+ implantation 1-gen-2006 M. Ferri; S. Solmi; D. Nobili; A. Armigliato
Development of MEMS strain sensors for crack monitoring in ageing civil infrastructures 1-gen-2008 Ferri M; Mancarella F; Seshia A; Ransley J; Soga K; Zalesky J;Roncaglia A
Epitaxial growth, mechanical and electrical properties of SiC/Si and SiC/poly-Si 1-gen-2012 Bosi, M; Attolini, G; Watts, Be; Roncaglia, A; Poggi, A; Mancarella, F; Moscatelli, F; Belsito, L; Ferri, M
Fabrication and packaging techniques for the application of MEMS strain sensors to wireless crack monitoring in ageing civil infrastructures 1-gen-2010 Ferri, M; Mancarella, F; Seshia, A; Ransley, J; Soga, K; Zalesky, J; Roncaglia, A
Fabrication and testing of a high resolution extensometer based on resonant MEMS strain sensors 1-gen-2011 Ferri M;Belsito L;Mancarella F;Masini L;Roncaglia A;Yan J;Seshia; A A;Zalesky J;Soga; K