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RIGHINI, MARCOFABIO

RIGHINI, MARCOFABIO  

Istituto dei Sistemi Complessi - ISC  

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Risultati 1 - 20 di 21 (tempo di esecuzione: 0.018 secondi).
Titolo Data di pubblicazione Autore(i) File
Evaluation of the radiative recombination mechanism in Si nanocrystals embedded in silica matrix 1-gen-2008 Righini, M; Gnoli, A; Razzari, L; Serincan, U; Turan, R
Thermal activation energy of crystal and amorphous nano-silicon in SiO2 matrix 1-gen-2008 Wang, J; Righini, M; Gnoli, A; Foss, S; Finstad, T; Serincan, U; Turan, R
Excited-state dynamics and nonlinear optical response of Ge nanocrystals embedded in silica matrix 1-gen-2006 Razzari, L.; Gnoli, A.; Righini, M.; Dâna, A.; Aydinli, A.
Gelatine sizing and discoloration: a comparative study of optical spectra obtained from ancient and artificially aged modern papers 1-gen-2006 Missori, M.; Righini, M.; Dupont, A. L.
Z-scan measurements using high repetition rate lasers: how to manage thermal effects 1-gen-2005 Andrea Gnoli; Luca Razzari; Marcofabio Righini
Optical reflectance spectroscopy of ancient papers with discoloration or foxing 1-gen-2004 Missori M.; Righini M.; Selci S.
High-quality Cr-doped InGaAs/InP(100) MQWs grown by tert-butylarsine in a MOVPE apparatus 1-gen-2003 Carta G.; D'Andrea A.; FernándezAlonso F.; Franco A.; El Habra N.; Righini M.; Rossetto G.; Schiumarini D.; Selci S.; Zanella P.
High-quality, Cr-doped InGaAs/InP(001) MQWs grown by tert-butylarsine in a MOVPE apparatus 1-gen-2003 Carta G. ; D'Andrea A. ; FernándezAlonso F.; Franco A. ; El Habra N. ; Righini M. ; Rossetto G. ; Schiumarini D. ; Selci S. ; Zanella P.
Time-resolved differential reflectivity as a probe of on-resonance exciton dynamics in quantum wells 1-gen-2003 Fernándezalonso, F; Righini, M; Franco, A; Selci, S
Detection of subwavelength slit-width variation with irradiance measurements in the far field 1-gen-2002 Selci, S; Righini, M
Third-order optical non-linearities in titanium bis-phthalocyanine/toluene solutions 1-gen-2002 Fernandezalonso, F; Marovino, P; Paoletti, Am; Righini, M; Rossi, G
Effects of HF attack on the surface and interface microchemistry of W tips for use in the STM microscope: a scanning Auger microscopy (SAM) study 1-gen-1999 Paparazzo E;Moretto L;Selci S;Righini M;Farné; I
Linear and nonlinear optical properties of stepped InxGa1-xAs/GaAs quantum wells 1-gen-1998 Tomassini, N; D'Andrea, Andrea; Righini, M; Selci, S; Calcagnile, L; Cingolani, R; Schiumarini, D; Simeone, ; M, G
QuantitativeTopography Correction by Spectroscopy Deconvolution of Scanning Probe Images 1-gen-1996 Ferrari, L; Muscolino, M; Righini, M; Selci, Stefano; S,
Scanning Tunneling Microscopy Topography and Chemical Contrast Modes for Surface Analysis: A GaAs Surface Example 1-gen-1996 Selci, S; Ferrari, L; Righini, Marcofabio; M,
Exciton states in InxGa1-x As/GaAs double quantum wells: Normalized reflection spectra 1-gen-1995 D'Andrea, Andrea; Tomassini, N; Ferrari, L; Righini, M; Selci, S; Bruni, MARIA RITA; M, R; Simeoni, ; G,
Normalized reflection spectra in InxGa1-xAs/GaAs strained quantum wells: Structure and electronic properties 1-gen-1995 D'Andrea A;Tomassini N;Ferrari L;Righini M;Selci S;Bruni; M R;Simeone; M G
Optical and spectroscopic characterization of GaAs passivated surfaces 1-gen-1995 Ferrari L;Fodonipi M;Righini M;Selci; S
Early stages of nucleation and growth of diamond film by AES, SEM, UPS and optical reflectivity techniques: Surface composition 1-gen-1993 Ferrari, L; Selci, S; Felici, ; A, C; Righini, M; Scarselli, ; M, A; Cricenti, A; Polini, ; R,
Imaging Si(111) 2 X 1 surface by STM 1-gen-1993 Righini, M; Cricenti, A; Selci, Stefano; S,