Lanthanum cobaltite (LaCoO3) nanosystems were synthesised by an innovative combined use of thechemical vapor deposition (CVD) and sol-gel (SG) routes. In particular, a lanthanum oxyfluoridebased layer was deposited by CVD on CoOx(OH)y SG substrates (xerogel). The subsequent thermaltreatment in air, between 400 and 900 °C, was aimed at promoting the solid-state reaction betweenLa-O and Co-O based layers, resulting in the complete formation of LaCoO3. The obtained sampleswere analyzed by glancing incidence x-ray diffraction (GIXRD), transmission electron microscopy(TEM), atomic force microscopy (AFM), secondary ion mass spectrometry (SIMS), x-rayphotoelectron (XPS) and x-ray excited Auger electron (XE-AES) spectroscopies, for a detaileddetermination of their microstructure, chemical composition, and surface morphology. The presentwork focuses on the XPS and XE-AES analysis of a selected lanthanum cobaltite (LaCoO3) thinfilm, annealed at 700 °C for 2 h. Besides the wide scan spectrum, detailed spectra for the La 3d, Co2p, Co LMM, O 1s, and C 1s regions and related data are presented and discussed. Both theexperimental Co 2p3/2-Co 2p1/2 energy splitting and the evaluation of the Auger parameter point outto the formation of single-phase lanthanum cobaltite thin film. The presence of fluorine was neverdetected, indicating its elimination after thermal treatment. Moreover, carbon contamination wasmerely limited to the outermost sample layers.
LaCoO3 nanosystems by an hybrid CVD/Sol-Gel Route: an XPS investigation
L Armelao;D Barreca;G Bottaro;
2003
Abstract
Lanthanum cobaltite (LaCoO3) nanosystems were synthesised by an innovative combined use of thechemical vapor deposition (CVD) and sol-gel (SG) routes. In particular, a lanthanum oxyfluoridebased layer was deposited by CVD on CoOx(OH)y SG substrates (xerogel). The subsequent thermaltreatment in air, between 400 and 900 °C, was aimed at promoting the solid-state reaction betweenLa-O and Co-O based layers, resulting in the complete formation of LaCoO3. The obtained sampleswere analyzed by glancing incidence x-ray diffraction (GIXRD), transmission electron microscopy(TEM), atomic force microscopy (AFM), secondary ion mass spectrometry (SIMS), x-rayphotoelectron (XPS) and x-ray excited Auger electron (XE-AES) spectroscopies, for a detaileddetermination of their microstructure, chemical composition, and surface morphology. The presentwork focuses on the XPS and XE-AES analysis of a selected lanthanum cobaltite (LaCoO3) thinfilm, annealed at 700 °C for 2 h. Besides the wide scan spectrum, detailed spectra for the La 3d, Co2p, Co LMM, O 1s, and C 1s regions and related data are presented and discussed. Both theexperimental Co 2p3/2-Co 2p1/2 energy splitting and the evaluation of the Auger parameter point outto the formation of single-phase lanthanum cobaltite thin film. The presence of fluorine was neverdetected, indicating its elimination after thermal treatment. Moreover, carbon contamination wasmerely limited to the outermost sample layers.| File | Dimensione | Formato | |
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