In this work we use x-ray photoelectron spectroscopy (XPS! to analyze the principal core levels of a ZrO2 thin film deposited on glass using Zr(OPri)3(dpm) (OPri = isopropoxy; hdpm = 2,2,6,6-tetramethyl-3,5-heptanedione) as precursor. Besides the general survey, charge corrected binding energies for the Zr 3d5/2, Zr 3d3/2, O 1s, and C 1s photoelectrons are reported. Deconvolution of the O 1s signal reveals the presence of -OH groups and adsorbed water, whose presence can be related to the air exposure of the film between its preparation and XPS analysis.
Zirconium dioxide thin films characterized by XPS
GERBASI, ROSALBA;BARRECA, DAVIDE
2000
Abstract
In this work we use x-ray photoelectron spectroscopy (XPS! to analyze the principal core levels of a ZrO2 thin film deposited on glass using Zr(OPri)3(dpm) (OPri = isopropoxy; hdpm = 2,2,6,6-tetramethyl-3,5-heptanedione) as precursor. Besides the general survey, charge corrected binding energies for the Zr 3d5/2, Zr 3d3/2, O 1s, and C 1s photoelectrons are reported. Deconvolution of the O 1s signal reveals the presence of -OH groups and adsorbed water, whose presence can be related to the air exposure of the film between its preparation and XPS analysis.File in questo prodotto:
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