Structural investigation using X-ray synchrotron radiation has been performed on SrRuO3/SrTiO3/SrRuO3 epitaxial heterostructures, with each constituent layer a few unit cell thick grown on ( 001) SrTiO3 substrate. Detailed information on the evolution of the in-plane lattice structure has been obtained, in these heterostructures, by grazing incidence diffraction measurements. The samples have been grown by low-pressure pulsed laser deposition. Under our deposition conditions, SrRuO3 layers grow with an elongated cell perpendicular to the substrate surface. The in-plane pseudocubic lattice parameters do not match the in-plane square SrTiO3 structure even in the case of very thin SrRuO3 layers. Such a distortion was found to decrease with increasing the thickness of the SrTiO3 barrier layer.
Synchrotron X-ray diffraction study of SrRuO3/SrTiO3/SrRuO3 nano-sized heterostructures grown by laser MBE
CAruta;POrgiani;
2005
Abstract
Structural investigation using X-ray synchrotron radiation has been performed on SrRuO3/SrTiO3/SrRuO3 epitaxial heterostructures, with each constituent layer a few unit cell thick grown on ( 001) SrTiO3 substrate. Detailed information on the evolution of the in-plane lattice structure has been obtained, in these heterostructures, by grazing incidence diffraction measurements. The samples have been grown by low-pressure pulsed laser deposition. Under our deposition conditions, SrRuO3 layers grow with an elongated cell perpendicular to the substrate surface. The in-plane pseudocubic lattice parameters do not match the in-plane square SrTiO3 structure even in the case of very thin SrRuO3 layers. Such a distortion was found to decrease with increasing the thickness of the SrTiO3 barrier layer.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
