Surface roughness is a key point for all X-ray reflective optics, and is in general obtained through careful polishing and surface finishing. Here we propose a simple and inexpensive procedure to drastically reduce surface roughness: using sot-gel silica coatings. The motivation for this work is the improvement of X-ray mirrors obtained on Si substrate using micro-fabrication technology, where the usual polishing methods cannot be applied. Sol-gel silica layers dramatically reduce surface roughness and enhance the X-ray reflectivity up to acceptable values. The proof-of-principle presented in this paper can be further improved and applied to systems of different nature.

Surface roughness reduction in X-ray mirrors via sol-gel silica coatings

A Surpi;L Armelao;I Bukreeva;D Barreca;S Lagomarsino
2008

Abstract

Surface roughness is a key point for all X-ray reflective optics, and is in general obtained through careful polishing and surface finishing. Here we propose a simple and inexpensive procedure to drastically reduce surface roughness: using sot-gel silica coatings. The motivation for this work is the improvement of X-ray mirrors obtained on Si substrate using micro-fabrication technology, where the usual polishing methods cannot be applied. Sol-gel silica layers dramatically reduce surface roughness and enhance the X-ray reflectivity up to acceptable values. The proof-of-principle presented in this paper can be further improved and applied to systems of different nature.
2008
Istituto di fotonica e nanotecnologie - IFN
Istituto di Scienze e Tecnologie Molecolari - ISTM - Sede Milano
Istituto di Chimica della Materia Condensata e di Tecnologie per l'Energia - ICMATE
X-ray optics
sol-gel coatings
micro-fabrication
X-ray reflectivity
File in questo prodotto:
File Dimensione Formato  
prod_170040-doc_48693.pdf

solo utenti autorizzati

Descrizione: paper
Licenza: NON PUBBLICO - Accesso privato/ristretto
Dimensione 964.77 kB
Formato Adobe PDF
964.77 kB Adobe PDF   Visualizza/Apri   Richiedi una copia

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/157957
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 4
  • ???jsp.display-item.citation.isi??? 5
social impact